[1]陈 昊,李术林,杨瑞宵,等.三层复合 PI 薄膜厚度比对其介电性能影响[J].哈尔滨理工大学学报,2013,(05):10-12.
 CHEN Hao,LI Shu- lin,YANG ui- xiao,et al.The Influence of Thickness Ratio of Three- layer PI CompositeFilms on Dielectric Properties[J].哈尔滨理工大学学报,2013,(05):10-12.
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三层复合 PI 薄膜厚度比对其介电性能影响()
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《哈尔滨理工大学学报》[ISSN:1007-2683/CN:23-1404/N]

卷:
期数:
2013年05期
页码:
10-12
栏目:
材料科学与工程
出版日期:
2013-10-25

文章信息/Info

Title:
The Influence of Thickness Ratio of Three- layer PI Composite
Films on Dielectric Properties
作者:
陈 昊 李术林 杨瑞宵 范 勇
哈尔滨理工大学 材料科学与工程学院
Author(s):
CHEN Hao LI Shu- lin YANG Rui- xiao FAN Yong
School of Material Science and Engineering,Harbin University of Science and Technology
关键词:
聚酰亚胺薄膜 纳米杂化 TEM 击穿场强 耐电晕
Keywords:
PI films nano- composite TEM breakdown strength electric corona
分类号:
TM215. 3
文献标志码:
A
摘要:
摘 要:利用微乳化 -热液法制备纳米分散液, 制备了掺杂层与中间纯聚酰亚胺( PI) 层厚度
比不同的三层复合薄膜. 在相同环境条件下通过透射电镜( TEM) 击穿场强和耐电晕测试分别对
三层复合薄膜的微观结构和纳米掺杂层厚度比例的变化与介电性能的影响进行了分析. TEM 测试
结果表明纳米粒子在有机基体中的分散均匀; 介电强度测试和耐电晕测试表明随掺杂层厚度比例
的增加, 击穿场强逐渐下降, 耐电晕性能呈先上升后下降趋势.
Abstract:
Abstract: Micro emulsion- hydrothermal method was used in preparing a series of three- layer PI composite
films,which have different thickness ratio of doped PI layer and pure PI layer. Their microstructure were tested by
TEM and the dielectric properties were measured respectively by test of breakdown strength and electric corona,in
the same condition. The dimension scale of composite films was clearly shown from TEM test,and nano- particles
dispersed well in organic matrix. It can be observed that the breakdown strength is decreased,and electric corona
has a trend of increasing and then decreasing with the increase of thickness ratio of doped PI layer.

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[2]范勇,张洪亮,杨瑞宵,等.三层复合PI薄膜厚度比对其电导特性影响[J].哈尔滨理工大学学报,2013,(02):21.
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[3]范勇,谭及兰,谢艳红,等.纳米Zr-Ti-Al复合氧化物杂化PI薄膜的耐电晕性[J].哈尔滨理工大学学报,2014,(04):59.[doi:10.15938/j.jhust.2014.04.008]
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备注/Memo

备注/Memo:
国家自然科学基金( 50373008)
更新日期/Last Update: 2013-12-25